- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources6
- Resource Type
-
60000
- Availability
-
60
- Author / Contributor
- Filter by Author / Creator
-
-
Nagaraju, V. (6)
-
Fiondella, L. (5)
-
Aubertine, J. (2)
-
Chen, K. (2)
-
Faddi, Z. (1)
-
Jayasinghe, C. (1)
-
Luperon, M. (1)
-
Nafreen, M. (1)
-
Shi, Y. (1)
-
Steakelum, J. (1)
-
Wandji, T. (1)
-
and Fiondella, L. (1)
-
#Tyler Phillips, Kenneth E. (0)
-
#Willis, Ciara (0)
-
& Abreu-Ramos, E. D. (0)
-
& Abramson, C. I. (0)
-
& Abreu-Ramos, E. D. (0)
-
& Adams, S.G. (0)
-
& Ahmed, K. (0)
-
& Ahmed, Khadija. (0)
-
- Filter by Editor
-
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
(submitted - in Review for IEEE ICASSP-2024) (0)
-
- (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
A Hybrid Model Fitting Approach incorporating Particle Swarm Optimization and Statistical AlgorithmsNagaraju, V. ; Fiondella, L. ( , Reliability and Maintenance Engineering Summit)
-
Aubertine, J. ; Nagaraju, V. ; Fiondella, L. ( , International Conference on Reliability and Quality in Design)
-
Nagaraju, V. ; Jayasinghe, C. ; and Fiondella, L. ( , International Conference on Reliability and Quality in Design)
-
Steakelum, J. ; Aubertine, J. ; Chen, K. ; Nagaraju, V. ; Fiondella, L. ( , International Conference on Reliability and Quality in Design)
-
Nafreen, M. ; Nagaraju, V. ; Luperon, M. ; Shi, Y. ; Wandji, T. ; Fiondella, L. ( , International Conference on Reliability and Quality in Design)